Please use this identifier to cite or link to this item: http://www.repositorio.ufc.br/handle/riufc/2474
Title in Portuguese: Raman scattering and x-ray diffraction studies of polycrystalline CaCu3Ti4O12 under high-pressure
Author: Reis Júnior, Daniel Valim dos
Souza Filho, Antônio Gomes de
Freire, Paulo de Tarso Cavalcante
Fagan, Solange Binotto
Ayala, Alejandro Pedro
Mendes Filho, Josué
Almeida, Ana Fabíola Leite
Fechine, Pierre Basílio Almeida
Sombra, Antônio Sérgio Bezerra
Staun Olsen, J.
Gerward, L.
Keywords: Raios X - difração
Difração
Issue Date: 2004
Publisher: Physical Review B
Citation: VALIM, D. et al. Raman scarrering and X-ray difraction studies of polycrystalline CaCu3Ti4O12 under high-pressure. Physical Review. B, v. 70, p. 1-4, 2004.
Abstract: We report Raman scattering and x-ray diffraction studies of polycrystalline CaCu3Ti4O12 (CCTO) under high pressures. The pressure dependence of several Raman modes was investigated. No anomalies have been observed on the phonon spectra thereby indicating that the Th sIm 3¯d structure remains stable up to the maximum pressure s5.3 GPad we reached in this experiment. The pressure coefficients for the observed Raman modes were determined. This set of parameters was used for evaluating the stress developed in CCTO thin films. The high-pressure x-ray studies were extended up to 46 GPa and the data confirmed that the Th structure remains stable up to this pressure. The pressure-volume data are well described by the Birch’s equation of state. The experimental value of the zero pressure bulk modulus is B0=212±2 GPa. Grüneisen parameters of CCTO were also determined.
URI: http://www.repositorio.ufc.br/handle/riufc/2474
ISSN: 1098-0121
Appears in Collections:DEME - Artigos publicados em revista científica

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