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Título: Hydroxyapatite screen-printed thick films: optical and electrical properties
Autor(es): Silva, Cleber C.
Rocha, Hélio Henrique Barbosa
Freire, Francisco Nivaldo Aguiar
Santos, Manoel Roberval Pimentel
Saboia, Karlo David Alves
Góis, J. C.
Sombra, Antonio Sergio Bezerra
Palavras-chave: Filmes espessos
Microscopia eletrônica
Espectroscopia de espalhamento Raman
Data do documento: Jan-2005
Editor: Materials Chemistry and Physics
Citação: SILVA, C. C. ; ROCHA, H. H. B, ; FREIRE, F. N. A. ; SANTOS, M. R. P. ; SABOIA, K. D. A. ; GÓIS, J. C. ; SOMBRA, A. S. B. (2005)
Abstract: In this paper, we did a study on the structural and electrical properties of bioceramic hydroxiapatite (HA) thick films. The films were prepared in two layers using the screen-printing technique on Al2O3 substrates. Mechanical alloying has been used successfully to produce nanocrystalline powders of hydroxyapatite to be used in the films.We also look for the effect of the grain size of the HA in the final properties of the film. The samples were studied using X-ray diffraction (XRD), scanning electron microscopy (SEM), energy-dispersive spectroscopy (EDS), infrared and Raman scattering spectroscopy and electrical measurements. We did a study of the dielectric permittivity and the loss of the films in the radio-frequency of the spectra. The X-ray diffraction patterns of the films indicate that all the peaks associated to HA phase is present in the films. One can notice that, for all the films there is a decrease of the DC (dielectric constant) with the increase of the frequency. The values of the dielectric constant of the films are in between 4 and 9 (at 1 kHz), as a function of the flux concentration. The loss is decreasing as we increase the frequency for all the films. These results strongly suggest that the screen-printing HA thick films are good candidates for applications in biocompatible coatings of implant materials.
Descrição: SILVA, C. C. et al. Hydroxyapatite screen-printed thick films: optical and electrical properties. Materials Chemistry and Physics, v. 92, p. 260-268, 2005.
ISSN: 0254-0584
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